YIN, Min. Defect Prediction and Optimization in Semiconductor Manufacturing Using Explainable AutoML. Academic Journal of Natural Science , [S. l.], v. 2, n. 4, p. 1–10, 2025. DOI: 10.70393/616a6e73.333533. Disponível em: https://www.suaspress.org/ojs/index.php/AJNS/article/view/v2n4a01. Acesso em: 25 feb. 2026.