Yin M. Defect Prediction and Optimization in Semiconductor Manufacturing Using Explainable AutoML. Acad. J. Nat. Sci. [Internet]. 2025 Dec. 3 [cited 2026 Apr. 30];2(4):1-10. Available from: https://www.suaspress.org/ojs/index.php/AJNS/article/view/v2n4a01