YIN, Min. Multi-Task Learning for Anomaly Detection and Remaining Useful Life Prediction in Semiconductor Manufacturing Systems. Journal of Computer Technology and Applied Mathematics, [S. l.], v. 3, n. 1, p. 1–10, 2026. DOI: 10.70393/6a6374616d.333536. Disponível em: https://www.suaspress.org/ojs/index.php/JCTAM/article/view/v3n1a01. Acesso em: 19 jan. 2026.