YIN, Min. Data Quality Control in Semiconductor Manufacturing through Automated ETL Processes and Class Imbalance Handling Techniques. Journal of Industrial Engineering and Applied Science, London, U.K., v. 3, n. 6, p. 13–22, 2025. DOI: 10.70393/6a69656173.333532. Disponível em: https://www.suaspress.org/ojs/index.php/JIEAS/article/view/v3n6a03. Acesso em: 20 dec. 2025.