YIN, Min. Integrating Real-Time KPI Dashboards with Monte Carlo Simulation for Optimizing Semiconductor Manufacturing Processes. Journal of Intelligence and Engineering Technology, [S. l.], v. 1, n. 1, p. 27–39, 2026. DOI: 10.70393/6a696574.333837. Disponível em: https://www.suaspress.org/ojs/index.php/JIET/article/view/v1n1a04. Acesso em: 4 feb. 2026.